Improved Methods for Fault Diagnosis in Scan-Based BIST
نویسندگان
چکیده
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the analysis phase of the diagnosis algorithm improves diagnosis times significantly; furthermore, the deterministic partitioning approach results in even further reductions in diagnosis times together with higher predictability.
منابع مشابه
Deterministic partitioning techniques for fault diagnosis in scan-based BIST
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified and low cost hardware implementations of high quality deterministic partitions are outlined. The superiority of the partitions generated by the proposed approach is confirmed through mathematical analysis. Theoretical ...
متن کاملCost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST
of-the-art chip designs to improve test quality and reduce the cost of test development and application. Despite such benefits, designers have not adopted BIST as the primary test methodology. Fault diagnosis in a BIST environment is problematic because only limited information is available in a compact signature like that produced with BIST. Previous techniques have focused on extracting infor...
متن کاملError Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch
In this paper, we provide a practical formulation of the problem of identifying all error occurrences and all failed scan cells in atspeed scan based BIST environment. We propose a method that can be used to identify every error when the circuit test frequency is higher than the tester frequency. Our approach requires very little extra hardware for diagnosis and the test application time requir...
متن کاملSwitching Activity Reduction Using Scan Shift Operation
This paper presents BIST TPG (built in self test) for low power dissipation and high fault coverage a low hardware overhead test pattern generator (TPG) for scan-based built-in self-test (BIST) that can reduce switching activity in circuits under test (CUTs) during BIST and also achieve very high fault coverage with reasonable lengths of test sequences. The proposed BIST TPG subside transitions...
متن کاملFault diagnosis in scan-based BIST using both time and space information
A new technique for diagnosis in a scan-based BIST environment is presented. It allows non-adaptive identification of both the scan cells that capture errors (space information) as well as a subset of the failing test vectors (time information). Having both space and time information allows a faster and more precise diagnosis. Previous techniques for identifying the failing test vectors during ...
متن کامل